Magnification Calibration MRS-3 - Cleaning and Re-calibration Service Select:MRS-3/4/5 Cleaning and Re-coating only Silicon tip on Silicon Nitride

Silicon tip on Silicon Nitride cantilever

Recommended for use with any PeakForce tapping enabled Bruker AFM

Also suitable as an opaque microscopy support

and afm+ for CAFM measurements and contact mode imaging

Magnification Calibration MRS-3 - Cleaning and Re-calibration Service Select:MRS-3/4/5 Cleaning and Re-coating only Silicon tip on Silicon NitrideDESCRIPTION MRS 3 X Y R Cleaning, Re coating and Re calibration MRS 3 X Y Z R Cleaning, Re coating and Re calibration MRS 3 4 5 Cleaning and Re coating only The 10 x 50,000x Pitch Standard for Scanning Electron Microscopy Details of Traceability to NIST, NPL or ISO 9000 Compliance Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies and Profilometry STM, AFM, the pattern height is