Pay in 4 interest-free payments of $69.24 Learn more
Ships within 48 hours · Estimated delivery Aug 21 - Aug 26
3 cantilevers: 0
2500nm tall spike with 30nm end radius and 150nm base width
the DLC coated probes (Model# TESPD) provide a cost effective alternative
5 Back Angle: 15 ± 2
SD-103 Hi-Res 3 cantilevers: 0SPM cross sectional sample holder DESCRIPTION SPM cross sectional sample holder for all Veeco SPMs. This cross sectional sample holder is designed to hold a wafer cross section upright for edge inspection and it can be used on all microscopes; However, cross section cannot be taller than the height supported by the microscope. It is 0. 5" in diameter and 0. 175" tall. Includes a hex key.
