Tipcheck AFM Tip Characterizer PELCO® Grids 658-200-AU - Quantifoil®

658-200-AU - Quantifoil®

Supplied with M4 screw

15393-P - Wafer Holder for Notch Style Wafers

This holder supports Electrostatic Force Microscopy (EFM)

Tipcheck AFM Tip Characterizer PELCO® Grids 658-200-AU - Quantifoil®Sample for Analyzing AFM Tip Geometry DESCRIPTION Sample for Analyzing AFM Tip Geometry The problem: Blunt or broken tips falsify measurement results like surface roughness or structures dimensions dramatically! To ensure correct results, used tips must be thrown away or checked by SEM regularly, both methods being extremely uneconomic or time consuming. The solution: The TipCheck is an SPM sample for fast and convenient determination of the AFM tip