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PPP-NCH <20 nm lateral calibration of SPM scanners

SKU: 45425595595

4.0
USD365.32 USD385.32

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Description

lateral calibration of SPM scanners and detection of any lateral nonlinearity

7µm Cantilever C - Soft Tapping Cantilever D - Tapping Mode Shape Beam Shape Beam Force Constant 7

semiconductor and electronics manufacturing

Monocrystalline diamonds tend to have longer

PPP-NCH <20 nm lateral calibration of SPM scannersDESCRIPTION POINTPROBE PLUS SILICON SPM PROBE SILICON CANTILEVER FOR NON CONTACT TAPPING MODE

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