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292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids and an entry hole for

SKU: 53292686236

4.9
EUR1293.92 EUR1341.92

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Ships within 48 hours · Estimated delivery Aug 21 - Aug 26

Description

and an entry hole for counter and reference electrodes are integrated into the glass fluid cell

Packaging: 100 grids per vial/tube

160-42W by firmly grasping the head of the screw or the base of the pin

cross-section cannot be taller than the height supported by the microscope

292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids and an entry hole forDESCRIPTION Precision holographic grating standard with high contrast and excellent edge definition. Period: 292nm pitch nominal, one dimensional array. Accuracy is + 1%. Calibration certificate will give the actual pitch of the standard. Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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