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Large Ø63mm x 6mm pin height; shorter pin for all Zeiss/LEO SEM, FESEM & FIB systems AFM Disc Grippers Compartments are diamond shaped for

SKU: 65371412079

4.9
USD74.10 USD117.10

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Ships within 48 hours · Estimated delivery Aug 22 - Aug 27

Description

Compartments are diamond shaped for safe grid storage

Withstands radiation

This cost-effective probe has a nominal tip radius of 35 nm for excellent lateral resolution for MFM

Copper - pkg/50

Large Ø63mm x 6mm pin height; shorter pin for all Zeiss/LEO SEM, FESEM & FIB systems AFM Disc Grippers Compartments are diamond shaped forDESCRIPTION Large 63mm x 6mm pin height; shorter pin for all Zeiss LEO SEM, FESEM & FIB systems ZEISS LEO SEM, FESEM & FIB systems, aluminum, grooved edge, 63mm

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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