Maxtaform Style H7 TipChecker and Surface Potential Microscopy (SPoM)

and Surface Potential Microscopy (SPoM) modes on the Dimension Series and BioScope AFMs

4" wafer precut into 20 x 30mm chips approximately 6 chips/wafer

Dimensions of 25 TEM grid version: 35 x 35 x 6

the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants

Maxtaform Style H7 TipChecker and Surface Potential Microscopy (SPoM)DESCRIPTION Maxtaform Style H7 Mesh: 400 Pitch: 63 microns Hole: 51 microns Bar Width: 12 microns Transmission: 65% Maxtaform Reference Finder Grids, Style H7, 400 mesh, Copper, 100 vial Maxtaform Reference Finder Grids, Style H7, 400 mesh, Nickel, 100 vial Reference Finder Grids for Transmission Electron Microscopy A selection of TEM grids with reference patterns to enable relocating a particular grid area. Theses grids are known as reference,