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Microfabricated silicon probes that are ~450 microns long and are coated with ~25 nm of PtIr conductive coating on both sides of the cantilever
This is a set of calibration standards that can be used to calibrate the ThermaLeverTM probes
electrically conductive tip
Ready-to-scan test specimen
PELCO® Gold Coated Glass Coverslips AFM/SPM Calibration Microfabricated silicon probes that areDESCRIPTION PRODUCT SPECIFICATIONS High quality, borosilicate glass coverslips coated with 50nm of gold with a 5nm chromium adhesion layer between the coverslip surface and the gold coating. Can be used for a wide range of nanotechnology, biotechnology and AFM application. Both Cr and Au are evaporated on the glass coverslips using a vacuum evaporation system. The gold surface is not atomically flat, but has bumps in the nm range. The coverslips are
