Pelcotec™ G-1 Silicon Calibration Specimen - 1µm Pitch Reflex Aluminum A 10-pack of probes for

A 10-pack of probes for contact mode imaging and nanoIR spectroscopic measurements

Carbon replicas with Au/Pd shadowing of diffraction line gratings

Package of 100

Breaking of flat substrates is best facilitated using Product No

Pelcotec™ G-1 Silicon Calibration Specimen - 1µm Pitch Reflex Aluminum A 10-pack of probes forDESCRIPTION Includes 1m, 10m and 100m pitch The Pelcotec G 1 calibration specimen with a 1m pitch grid is very useful for magnification calibration or image distortion check in the 100x to 10,000x magnification range. Can be used for SEM, Auger, Sims, FIB, and LM (reflected light). Specimen may also be mounted directly on the Pelcotec G 1 which will give an accurate internal calibration in the image. Particularly useful when working with powders.