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This is then mounted on a magnetic sample puck
Excess resin is removed
These drift-compensated probes have a small laser-reflection enhancing gold pad
-- Seals cell against cover glass (EC-V2-CO VER GLASS) upon engage
Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM AFM/STM Disks This is then mounted onDESCRIPTION "Critical Dimension (CD) structures" are particularly useful for SEM FIB magnification calibration and may be used for AFM. Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful. The 4. 8 x 4. 8mm silicon standard has a series of patterns with a side length of 480m around its edges, helpful for orientation. There are three versions available. Version with a 10 5 2 1 0. 5um
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