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in cross section
Monolithic silicon AFM probe for contact mode and lateral force mode operation
150mm (6")
Tin on Carbon
Tap190Al-G Select Quantity:50 per set in cross sectionTapping Mode AFM Probe with Long Cantilever DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Tapping Mode AFM Probe with Long Cantilever Monolithic silicon AFM probe for high frequency non contact and tapping mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is
